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An apple II based datasystem for AES depth profiling on a varian spectrometer
Author(s) -
Hazell L. B.,
Baker C.,
Dearden D. P.
Publication year - 1985
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740070307
Subject(s) - profiling (computer programming) , software , subtraction , computer science , auger , physics , mathematics , operating system , arithmetic , atomic physics
A description is given of an Apple II based Auger spectroscopy datasystem specifically designed for depth profiling applications. Software features which are not available on commercial systems are emphasized. In particular, the utility of peak overlap and noise threshold subtraction routines are demonstrated with reference to two examples of practical profiling.