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A simple method for removing overlapped Auger signals from ELS or low energy reflection mode EXELFS
Author(s) -
Matsuta Hideyuki,
Hirokawa Kichinosuke
Publication year - 1985
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740070304
Subject(s) - auger , energy (signal processing) , reflection (computer programming) , oscillation (cell signaling) , low energy , auger electron spectroscopy , modulation (music) , signal (programming language) , mode (computer interface) , electron , sample (material) , optics , materials science , physics , chemistry , atomic physics , acoustics , computer science , biochemistry , quantum mechanics , nuclear physics , thermodynamics , programming language , operating system
Two simple techniques are described for eliminating overlapped intense Auger signals from electron energy loss spectrum. One is performed by superimposing a small oscillation on both the sample and the CMA band pass energy and detecting only signals which are not altered by the modulation, the other is performed by applying large bias voltage to the sample. These techniques can be used to extract the low energy reflection mode extended electron energy loss fine structure (EXELFS) signals.