Premium
A. Benninghoven, J. Okano, R. Shimizu and H. W. Werner (Editors). Secondary ion mass spectrometry (SIMS IV). Springer‐Verlag, Berlin, 1984, 500 pp., $38.50
Author(s) -
Brown Alan
Publication year - 1985
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740070210
Subject(s) - citation , chemistry , library science , secondary ion mass spectrometry , mass spectrometry , computer science , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom