Channeling effects in polycrystalline copper—a serious impediment to quantitative Auger analysis? | Zendy

Doern F. E. | Zendy; Kover L. | Zendy; McIntyre N. S. | Zendy

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Channeling effects in polycrystalline copper—a serious impediment to quantitative Auger analysis?

Author(s) -

Doern F. E.,

Kover L.,

McIntyre N. S.

Publication year - 1984

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740060607

Subject(s) - auger , microprobe , auger electron spectroscopy , copper , crystallite , auger effect , yield (engineering) , electron microprobe , chemistry , atomic physics , intensity (physics) , resolution (logic) , materials science , analytical chemistry (journal) , optics , crystallography , mineralogy , physics , nuclear physics , metallurgy , organic chemistry , chromatography , artificial intelligence , computer science

Variations in absolute Auger intensity of as much as 40% are reported for the analysis of polycrystalline copper surfaces in a high resolution scanning Auger microprobe. The angular dependent Auger yield is correlated with channeling effects of the incident electron beam. A correction procedure based upon ratioing the Auger peak intensity to the elastically backscattered electron peak, combined with an angular averaging technique can reduce the crystallographically induced Auger yield variations by a factor of four.

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