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The role of electron spectroscopy in the evolution of long‐range industrial R&D illustrated by AES studies in adhesion, catalysis and corrosion
Author(s) -
van Ooij W. J.,
Visser T. H.,
Biemond M. E. F.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060502
Subject(s) - auger electron spectroscopy , corrosion , adhesion , spectroscopy , range (aeronautics) , metallurgy , analytical chemistry (journal) , catalysis , energy dispersive x ray spectroscopy , materials science , chemistry , nanotechnology , scanning electron microscope , composite material , physics , environmental chemistry , organic chemistry , nuclear physics , quantum mechanics
The improvement in spatial resolution of scanning Auger spectroscopy in recent years has increased its applicability to industrial problems markedly, as is illustrated by several case studies in adhesion, corrosion and related areas. It is shown that the analytical capabilities of AES are enhanced if complemented by simultaneous energy‐dispersive x‐ray analysis. Suggestions for further development of AES instruments for use in industrial R&D are given.