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Application of X‐ray‐induced Auger electron spectroscopy to state analyses of hydrogen implanted in Y, Zr and Nb metals
Author(s) -
Baba Yuji,
Sasaki Teikichi A.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060405
Subject(s) - auger electron spectroscopy , x ray photoelectron spectroscopy , chemical state , auger , electron spectroscopy , hydrogen , spectral line , metal , spectroscopy , chemistry , analytical chemistry (journal) , atomic physics , ion , x ray , nuclear magnetic resonance , physics , organic chemistry , astronomy , quantum mechanics , chromatography , nuclear physics
X‐ray‐induced Auger electron spectroscopy (XAES) was used to examine the surface chemical states of hydrogen implanted metals. The chemical shifts of the M 4,5 N 2,3 V Auger peaks from their metallic states were 1.0 eV, 3.3 eV and 2.2 eV, respectively, for ion‐implanted Y, Zr and Nb. The separation energies were found to be much larger than those of the corresponding 3d 5/2 lines in the XPS spectra.