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Status report on the ASTM E‐42 Committee on surface analysis
Author(s) -
Nelson G. C.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060308
Subject(s) - terminology , ion beam analysis , library science , auger electron spectroscopy , engineering , analytical chemistry (journal) , engineering physics , materials science , ion beam , chemistry , computer science , physics , environmental chemistry , beam (structure) , nuclear physics , philosophy , linguistics , civil engineering
Committee E‐42 on Surface Analysis was formed by the American Society for Testing and Materials in 1976 from its predecessor, Subcommittee E‐02.02, to advance the quality of standard practices, standard materials, and reference data in the area of surface analysis. These objectives are accomplished through sponsoring symposia and workshops at the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy in the spring and the National Symposium of the American Vacuum Society in the autumn of each year as well as through the development of recommended practices, standard materials, round robin comparisons, and publications. Subcommittees which are currently active are Editorial, Terminology, Standard Reference Materials, Ion Beam Sputtering, Energetic Ion Analysis, Auger, ESCA, ISS, and SIMS. This report summarizes their progress to the end of 1983.