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AES and XPS depth profiling certified reference material
Author(s) -
Hunt C. P.,
Anthony M. T.,
Seah M. P.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060211
Subject(s) - certification , library science , division (mathematics) , national laboratory , computer science , engineering , engineering physics , political science , mathematics , arithmetic , law