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Characterization of fresh and spent HDS catalysts by Auger and X‐ray photoelectron spectroscopies
Author(s) -
Brinen J. S.,
Graham S. W.,
Hammond J. S.,
Paul D. F.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060206
Subject(s) - auger , catalysis , x ray photoelectron spectroscopy , auger electron spectroscopy , characterization (materials science) , spectral line , refining (metallurgy) , x ray , resolution (logic) , chemistry , analytical chemistry (journal) , materials science , chemical engineering , metallurgy , nanotechnology , optics , physics , atomic physics , organic chemistry , computer science , nuclear physics , engineering , astronomy , artificial intelligence
High resolution scanning Auger measurements have been made of HDS catalysts recovered from a heavy oil refining operation. Element maps and Auger spectra point out spectral inhomogeneities existing on the used catalyst which hitherto have not been reported. Once charging has been controlled, the information obtained sheds a new dimension for the study of catalysts on insulating support materials.