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Inelastic electron tunnelling spectroscopy of silane coupling agents
Author(s) -
Brewis D. M.,
Comyn J.,
Oxley D. P.,
Pritchard R. G.,
Reynolds S.,
Werrett C. R.,
Kinloch A. J.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060107
Subject(s) - quantum tunnelling , oxide , spectral line , chemistry , silane , epoxide , electron , adsorption , spectroscopy , photochemistry , materials science , organic chemistry , catalysis , physics , optoelectronics , quantum mechanics , astronomy
Inelastic electron tunnelling (IET) spectra are reported and assigned for some trialkoxysilanes adsorbed on aluminium oxide. Spectra of the triethoxysilanes have many common features, and there is some evidence that these compounds are attached to the oxide surface by their ethoxy groups. There are differences in the trimethoxysilane spectra which may be due to a reaction at the oxide surface during junction preparation. In particular, IET spectra of 3‐glycidoxypropyltrimethoxysilane show that the epoxide group reacts to producegroups.