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XPS study of ethyl xanthate adsorbed onto cuprous sulphide
Author(s) -
Mielczarski Jerzy,
Suoninen Eero
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060106
Subject(s) - xanthate , adsorption , chemistry , monolayer , x ray photoelectron spectroscopy , inorganic chemistry , molecule , crystallite , aqueous solution , organic chemistry , crystallography , chemical engineering , biochemistry , engineering
Adsorption of xanthate ions from an aqueous solution of potassium ethyl xanthate onto the surface of synthetic polycrystalline chalcocite (Cu 2 S) samples has been studied by measuring the XPS lines Cu 2p 3/2 , O 1s, C 1s and S 2p from samples exposed for different times to the xanthate solution. The analysis takes into account the attenuation of the signals, arising from the composition of the sample surface and the orientation of the adsorbed species. The adsorption mechanism is found to consist of a relatively rapid formation of a well‐oriented monolayer of xanthate ions followed by a slow growth of a disordered cuprous xanthate molecules on top of this layer. This mechanism seems to be common for the adsorption of xanthate on many different substrates.