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Quantitative attenuated total reflection (ATR) spectroscopy of films with an absorption gradient
Author(s) -
Stuchebryukov S. D.,
Vavkushevsky A. A.,
Rudoy V. M.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060105
Subject(s) - attenuated total reflection , spectroscopy , reflection (computer programming) , absorption (acoustics) , optics , wavelength , absorption spectroscopy , materials science , radiation , chemistry , analytical chemistry (journal) , optoelectronics , physics , chromatography , quantum mechanics , computer science , programming language
A method for quantitatively studying the absorption gradients in films of a thickness of an incident radiation wavelength, by means of attenuated total reflection (ATR) spectroscopy is proposed. The possibilities and limitations of the method are discussed.