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Static SIMS for applied surface analysis
Author(s) -
Brown A.,
Vickerman J. C.
Publication year - 1984
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740060102
Subject(s) - static secondary ion mass spectrometry , secondary ion mass spectrometry , fast atom bombardment , mass spectrometry , chemistry , analytical chemistry (journal) , high resolution , surface science , surface (topology) , chromatography , geology , remote sensing , geometry , mathematics
A review is presented of the use of static secondary ion mass spectrometry (SSIMS) and fast atom bombardment mass spectrometry (FABMS) in applied surface analysis. Some common criticisms of SIMS are discussed first, and then the experimental apparatus required is described briefly. Four main areas of application have been chosen: catalysts, polymers, glasses and metals, to illustrate the power of SSIMS/FABMS in characterising the chemical state of material surfaces. Finally the very new technique of SSIMS imaging has been described and some preliminary results presented, to indicate its potential in obtaining chemical state information at high spatial resolution.