Premium
Small area x‐ray photoelectron spectroscopy
Author(s) -
Yates K.,
West R. H.
Publication year - 1983
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740050508
Subject(s) - x ray photoelectron spectroscopy , analyser , spectrometer , analytical chemistry (journal) , x ray , electron spectrometer , phase (matter) , materials science , sample (material) , electron , chemistry , optics , nuclear magnetic resonance , physics , cathode ray , environmental chemistry , organic chemistry , quantum mechanics , chromatography
Small area XPS can be easily performed on spectrometers with hemispherical analysers, in which electron transfer from sample to analyser precedes retardation. Spatial resolutions of 250 μm diameter have been achieved on a commercial spectrometer and applied to the study of a mixed phase sulphide mineral. Determination of the position and size of the analysis area has been made by a combined SEM/SAM technique.