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Suppression of molecular ions in the secondary ion mass spectra of minerals
Author(s) -
Metson J. B.,
Bancroft G. M.,
McIntyre N. S.,
Chauvin W. J.
Publication year - 1983
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740050503
Subject(s) - mass spectrum , ion , chemistry , polyatomic ion , spectral line , analytical chemistry (journal) , secondary ion mass spectrometry , primary (astronomy) , resolution (logic) , molecular mass , mass spectrometry , trace element , environmental chemistry , physics , chromatography , organic chemistry , astronomy , artificial intelligence , computer science , biochemistry , enzyme
A new approach to the suppression of molecular ions in secondary ion mass spectra of insulating specimens is reported. Using a Cameca IMS 3f instrument, with unconventional primary beam conditions and uncoated samples, it has been possible to almost eliminate the contribution of molecular ions to the mass spectrum. This has resulted in excellent discrimination for major and trace element detection in these materials, including complete resolution of the rare earth elements in a number of minerals.