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Surface quantitative analysis of CrO systems by XPS
Author(s) -
Battistoni C.,
Cossu G.,
Mattogno G.,
Paparazzo E.
Publication year - 1983
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740050410
Subject(s) - x ray photoelectron spectroscopy , elemental analysis , analytical chemistry (journal) , spectral line , chemistry , materials science , inorganic chemistry , nuclear magnetic resonance , environmental chemistry , physics , astronomy
A comparison among O/Cr atomic ratios obtained from XPS Cr 2p 3/2 and O 1s spectra in pure inorganic compounds, employing the Elemental Sensitivity Factors approach and the so‐called ‘First‐Principles Model’ is reported.
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