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A simple background correction for AES peak height measurements
Author(s) -
Labohm F.
Publication year - 1982
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740040504
Subject(s) - simple (philosophy) , line (geometry) , range (aeronautics) , energy (signal processing) , low energy , optics , mathematics , analytical chemistry (journal) , statistics , physics , materials science , chemistry , atomic physics , geometry , philosophy , epistemology , chromatography , composite material
A very simple background correction is described, which largely removes the error introduced by the AES background signal. The correction consists of adding a fixed amount, equal to the change in the background across the AES line, to the measured peak height. The correction is particularly important for the measurement of small coverages of elements displaying AES lines in the low energy range of the spectrum. No computer is necessary. An example concerning C on Ni(100) is given.