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Analysis of polymer surfaces by SIMS. 2—fingerprint spectra from simple polymer films
Author(s) -
Briggs D.
Publication year - 1982
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740040405
Subject(s) - polystyrene , polymer , analytical chemistry (journal) , mass spectrum , polypropylene , polyethylene , static secondary ion mass spectrometry , spectral line , materials science , methacrylic acid , mass spectrometry , high density polyethylene , fragmentation (computing) , polymer chemistry , secondary ion mass spectrometry , chemistry , composite material , organic chemistry , chromatography , copolymer , physics , astronomy , computer science , operating system
Seven polymers (low density polyethylene, polypropylene, polystyrene, polymethylmethacrylate, poly(methacrylic acid), Nylon‐6 and poly(ethyleneterephthalate)) have been studied by SIMS. Very good signal: noise spectra up to mass 250 have been obtained using low damage conditions (i.e. ion current densities ∽1 nA cm −2 ) and electron beam charge neutralization. The spectra are highly characteristic and fairly easily interpreted using fragmentation data from electron impact mass spectrometry.