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Analysis of polymer surfaces by SIMS 1. An investigation of practical problems
Author(s) -
Briggs D.,
Wootton A. B.
Publication year - 1982
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740040306
Subject(s) - static secondary ion mass spectrometry , ion , polystyrene , secondary ion mass spectrometry , mass spectrum , polymer , desorption , ion beam , analytical chemistry (journal) , mass spectrometry , chemistry , resolution (logic) , secondary electrons , beam (structure) , chemical physics , materials science , electron , adsorption , organic chemistry , chromatography , optics , physics , nuclear physics , computer science , artificial intelligence
Secondary ion mass spectrometry has the potential for high spatial resolution surface analysis of polymers via fingerprint mass spectra and the use of a focused ion beam. Several problems stand in the way of realizing this potential, namely: (a) the expected high rate of ion beam damage, (b) the need for charge neutralization leading to (c) the uncertainty of surface potential and (d) the possibility of electron stimulated desorption of secondary ions. The importance of these effects have been studied using a model short chain hydrocarbon and films of polystyrene and polytetrafluoroethylene.