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An asymmetric model for XPS analysis
Author(s) -
Dunn William L.,
Dunn Terry S.
Publication year - 1982
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740040302
Subject(s) - x ray photoelectron spectroscopy , spectral line , gaussian , kinetic energy , monochromatic color , binding energy , spectrometer , computational physics , gaussian function , chemistry , analytical chemistry (journal) , atomic physics , molecular physics , physics , optics , computational chemistry , quantum mechanics , nuclear magnetic resonance , chromatography
The process of determining the overlapping peaks in complex X‐ray photoelectron spectra of polymer surfaces is posed mathematically as an inverse problem whose solution can be reduced to a standard least‐squares procedure. Various models can be generated by assuming specific forms for the distribution of effective binding energies corresponding to photoelectron kinetic energies and for the spreading kernel characteristic of the spectrometer. A particular generalized asymmetric model is developed for monochromatic X‐ray photoelectron spectroscopy of polymer surfaces based on physically meaningful electron energy loss characteristics and assuming the spreading kernel to possess both Gaussian and Lorentzian forms. Computer fits to experimental X‐ray photoelectron spectra indicate that the asymmetric model and curve‐fitting procedures employed offer an effective and flexible means for analyzing X‐ray photoelectron spectra.