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A contribution to the investigation of enamel/metal Interfaces
Author(s) -
Baumgartl S.,
Warnecke W.,
Holm R.
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030411
Subject(s) - microanalysis , auger , enamel paint , electron probe microanalysis , auger electron spectroscopy , diffusion , metal , layer (electronics) , adhesion , chemistry , analytical chemistry (journal) , resolution (logic) , mineralogy , materials science , metallurgy , electron microprobe , composite material , atomic physics , chromatography , physics , organic chemistry , artificial intelligence , computer science , nuclear physics , thermodynamics
Abstract The diffusion processes which influence the adhesion between enamel and metals take place in an ∼5 μm thick layer at the interface. Electron X‐ray microanalysis cannot be used to investigate this zone, except to a limited extent, because its depth and lateral resolution are inadequate. A procedure which permits quantitative determination of Fe in the zone at the interface is described. It is based on X‐ray and Auger microanalysis of tapered sections. The Auger intensities are quantified by X‐ray microanalysis within sufficiently thick enamel layers.