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Use of XPS to detect variations in dispersion of impregnated and ion‐exchanged NiO/SiO 2 systems
Author(s) -
Houalla M.,
Delmon B.
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030302
Subject(s) - non blocking i/o , dispersion (optics) , x ray photoelectron spectroscopy , ion , intensity (physics) , nickel , analytical chemistry (journal) , materials science , series (stratigraphy) , chemistry , nuclear magnetic resonance , optics , metallurgy , physics , geology , chromatography , catalysis , organic chemistry , paleontology
The use of XPS intensity measurements to follow the dispersion of impregnated and ion‐exchanged NiO/SiO 2 samples has been examined. Intensity measurements clearly demonstrate the profound difference in dispersion between the two series. Moreover, as revealed by comparison with independent dispersion measurements, they adequately predict the evolution of the dispersion of NiO as a function of nickel content in the impregnated series.