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Standard practice for approximate determination of the current fensity of large‐diameter ion beams for depth profiling of solid surfaces (E 684–79)
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030211
Subject(s) - profiling (computer programming) , ion , analytical chemistry (journal) , mathematics , chemistry , computer science , chromatography , organic chemistry , operating system
This standard is issued under the fixed designation E 684; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval.