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A. Benninghoven, C. A. Evans jr, R. A. Powell, R. Shimizu and R. A. Storms. Secondary ion mass spectrometry: Proceedings of the second international conference on secondary ion mass spectrometry (SIMS II). Springer Series in Chemical Physics, Vol. 9. Springer, Berlin, 1979, xiii + 298 pp., 234 Figs. DM58.00 $34.30 (approx)
Author(s) -
Wittmaack K.
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030115
Subject(s) - secondary ion mass spectrometry , mass spectrometry , chemistry , analytical chemistry (journal) , library science , computer science , environmental chemistry , chromatography
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