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Defect structures at solid surfaces
Author(s) -
Lagally M. G.,
Welkie D. G.
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030106
Subject(s) - diffraction , electron diffraction , low energy electron diffraction , materials science , intensity (physics) , x ray crystallography , surface (topology) , solid surface , optics , gas electron diffraction , crystallography , molecular physics , reflection high energy electron diffraction , atomic physics , physics , chemistry , geometry , chemical physics , mathematics
The analysis of surface structural defects at the atomic level using low energy electron diffraction (LEED) is briefly considered. The angular distribution of the diffracted intensity contains information on the defect structure. A number of defects can be distinguished and quantified by studying the behavior of the angular width of diffracted beams with changes in diffraction parameters.