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Surface structural investigations by photoemission spectroscopy
Author(s) -
Margaritondo G.
Publication year - 1981
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740030105
Subject(s) - x ray photoelectron spectroscopy , photoemission spectroscopy , angle resolved photoemission spectroscopy , inverse photoemission spectroscopy , surface (topology) , diffraction , materials science , chemistry , electronic structure , physics , condensed matter physics , optics , nuclear magnetic resonance , geometry , mathematics
Photoemission techniques are currently being used by several authors for surface geometry investigations. In particular great emphasis is being placed on photoelectron diffraction effects in the final state which are a direct source of structural information. Other surface structure investigations involve more conventional initial‐state photoemission experiments. We briefly discuss some of the above appraches and their advantages with respect to the ‘traditional’ structural probes.