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ISS/SIMS characterization of mica surfaces
Author(s) -
Baun W. L.
Publication year - 1980
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740020405
Subject(s) - mica , secondary ion mass spectrometry , cleavage (geology) , characterization (materials science) , chemisorption , chemistry , potassium , analytical chemistry (journal) , ion , diffusion , layer (electronics) , materials science , nanotechnology , chromatography , metallurgy , composite material , adsorption , physics , organic chemistry , fracture (geology) , thermodynamics
SIMS and ISS are used to characterize mica surfaces. The results on matching cleaved surfaces show that cleavage occurs along the potassium layer and the potassium ions are shared equally between the separated surfaces. A comparison of these freshly cleaved surfaces with original weathered surfaces shows large differences in the potassium content just at the surface. A mechanism of oxidation or chemisorption of water is suggested. Other ISS/SIMS data from treated mica surfaces show a high sensitivity for small chemical changes which take place on these surfaces. The experiments indicate that the ISS/SIMS technique should prove very useful for diffusion studies through thin films using mica surfaces.