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Reference levels in electron‐excited and X‐ray‐excited Auger spectra
Author(s) -
Wagner C. D.,
Taylor J. Ashley
Publication year - 1979
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740010207
Subject(s) - auger electron spectroscopy , excited state , auger , atomic physics , spectral line , x ray photoelectron spectroscopy , electron spectroscopy , spectroscopy , chemistry , confusion , physics , nuclear magnetic resonance , psychology , astronomy , quantum mechanics , nuclear physics , psychoanalysis
Auger spectroscopy and X‐ray photoelectron spectroscopy have evolved using different reference levels for electron energy measurement. Electron‐excited Auger spectra are referenced to the vacuum level, and X‐ray‐excited Auger spectra are referenced to the Fermi level. This can cause confusion, especially when both are recorded in the N ( E ) mode in the same instrument.