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Examination of contamination on electrical insulators by XPS
Author(s) -
Drummond I. W.
Publication year - 1979
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740010206
Subject(s) - x ray photoelectron spectroscopy , contamination , insulator (electricity) , materials science , adhesive , electrical breakdown , stripping (fiber) , composite material , analytical chemistry (journal) , chemical engineering , optoelectronics , chemistry , environmental chemistry , dielectric , ecology , layer (electronics) , engineering , biology
A method is described which allows samples to be taken form the surface of electrical insulators which suffer electrical breakdown. The insulator does not have to be removed form its immediate environment. The contaminant is removed by ‘stripping’ it off with adhesive tape and the tape is subsequently examined by XPS.