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Part I: Molecular weight characterization of linear polydimethyl siloxanes by secondary ion mass spectrometry
Author(s) -
Pacholski Michaeleen L.,
Vlasak Paul R.
Publication year - 2021
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6909
Subject(s) - silicone , secondary ion mass spectrometry , polymer , materials science , siloxane , molar mass distribution , characterization (materials science) , thin film , analytical chemistry (journal) , polydimethylsiloxane , polymer chemistry , chemical engineering , ion , chemistry , composite material , nanotechnology , organic chemistry , engineering
A correlation of SIMS ion intensities to the molecular weight of linear, trimethyl‐terminated polydimethyl siloxane (PDMS) has been developed by normalizing PDMS endgroup‐related signal to backbone‐related signal for a set of well‐characterized polymers with narrow molecular weight distributions. These initial experiments on thick PDMS films illustrate that PDMS molecular weight can be estimated using SIMS. A second paper describes the challenges in analyzing thin PDMS films on metal and polymer substrates. PDMS molecular weight determination is important to understanding surface‐related performance of materials using silicone additives across many different platforms including coefficient of friction, slip, mar, mold release, and nonstick properties as well as providing more specific characterization of surface contamination.