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Estimation of band alignment at CdS/Cu 2 ZnSnS 4 hetero‐interface by direct XPS measurements
Author(s) -
Tamin Charif,
Chaumont Denis,
Heintz Olivier,
Adnane Mohamed
Publication year - 2020
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6881
Subject(s) - czts , x ray photoelectron spectroscopy , heterojunction , band offset , valence band , conduction band , band gap , analytical chemistry (journal) , band diagram , valence (chemistry) , chemistry , materials science , spectroscopy , offset (computer science) , optoelectronics , nuclear magnetic resonance , electron , physics , computer science , organic chemistry , quantum mechanics , chromatography , programming language
This paper aims to estimate the band alignment to CdS/CZTS hetero‐interface by direct X‐ray photoelectron spectroscopy (XPS) measurements. XPS was used to determinate the valence‐band offset (VBO) directly by determining the valence band positions at the hetero‐interface. The conduction band offset (CBO) value was estimated based on the band gap measurements by UV/Visible spectroscopy and VBO measurements. The position of valence band (VB) changes close to the CdS‐CZTS interface and the CBO is cliff‐like. The band alignment diagram indicates that the CdS‐CZTS interface heterojunction is type II.