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Corrigenda: Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS
Publication year - 2020
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6858
Subject(s) - inelastic scattering , x ray photoelectron spectroscopy , physics , section (typography) , atomic physics , electron , scattering , chemistry , crystallography , nuclear physics , computer science , quantum mechanics , nuclear magnetic resonance , operating system
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