3D ToF‐SIMS view of interfacial diffusion between Cr 2 AlC coating and zircaloy substrate | Zendy

Zhang Lei | Zendy; Dai Chunli | Zendy; Zhang Jie | Zendy

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3D ToF‐SIMS view of interfacial diffusion between Cr 2 AlC coating and zircaloy substrate

Author(s) -

Zhang Lei,

Dai Chunli,

Zhang Jie

Publication year - 2020

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.6715

Subject(s) - coating , materials science , annealing (glass) , ceramic , substrate (aquarium) , zirconium alloy , analytical chemistry (journal) , composite material , alloy , chemistry , oceanography , geology , chromatography

A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr 2 AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl + after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.

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