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LaFeO 3 thin films as relevant models for the surface investigation of 3‐way catalysts
Author(s) -
Nandi Shreya,
Blanck Dimitri,
Carlier Thomas,
Chambrier MarieHélène,
Mamede AnneSophie,
Trentesaux Martine,
Simon Pardis,
Nuns Nicolas,
Roussel Pascal,
Ferri Anthony,
Paul JeanFrancois,
Berrier Elise
Publication year - 2018
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6450
Subject(s) - materials science , crystallite , thin film , characterization (materials science) , catalysis , orthoferrite , x ray photoelectron spectroscopy , lanthanum , nanotechnology , chemical engineering , surface (topology) , chemistry , inorganic chemistry , metallurgy , organic chemistry , physics , engineering , magnetization , geometry , mathematics , quantum mechanics , magnetic field
Lanthanum orthoferrite, a highly potential 3‐way catalyst, shaped as a polycrystalline thin film has been comprehensively analysed by combining bulk and surface characterization techniques. The possibility to accomplish unprecedented surface information has been presented, thanks to the combined use of LEIS, XPS, and ToF‐SIMS. The structural, morphological, and surface properties at nanometric scale make such thin films indistinguishable from powdered solids. Thus, the relevance of using such model materials for advanced surface investigations of LaFeO 3± δ ‐based 3‐way catalysts has been demonstrated.