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Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution
Author(s) -
Kobe Brad,
Badley Martin,
Henderson Jeffrey D.,
Anderson Samantha,
Biesinger Mark C.,
Shoesmith Dave
Publication year - 2017
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6325
Subject(s) - x ray photoelectron spectroscopy , crevice corrosion , materials science , corrosion , alloy , oxide , metallurgy , nanometre , inert , analytical chemistry (journal) , chemical engineering , composite material , chemistry , environmental chemistry , organic chemistry , engineering
This paper explores quantitative X‐ray photoelectron spectroscopy imaging on three different Ni‐Cr‐Mo Hastelloy® alloys (BC‐1, C‐22 and G‐30) with differing Cr and Mo contents. The alloys were subjected to a simulated critical crevice corrosion solution. Ni‐based alloys have been shown to exhibit excellent resistance to a range of corrosive media due to the formation of an inert oxide layer, primarily containing Cr and Mo. However, these alloys may rapidly corrode in the crevice environment produced by seams, gaskets or deposits of debris on the alloy surface. Understanding how the oxide film is influenced by the Cr and Mo content is crucial in determining an optimal alloy composition that reduces or suppresses the possibility of crevice corrosion. The protective oxide films are very thin in nature, generally several nanometers. XPS imaging was used to monitor changes in oxide film composition and to correlate the distribution of Cr and Mo to the grain structure of the alloys. Copyright © 2017 John Wiley & Sons, Ltd.