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Microstructural characterization of oxide layers formed on Ni–20Cr–8Al alloy foam using transmission electron microscopy
Author(s) -
Kim Hyung Giun,
Lim Sung Hwan
Publication year - 2017
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6236
Subject(s) - transmission electron microscopy , alloy , oxide , non blocking i/o , materials science , nichrome , layer (electronics) , characterization (materials science) , metallurgy , microstructure , scanning electron microscope , composite material , analytical chemistry (journal) , chemistry , nanotechnology , catalysis , chromatography , biochemistry
Microstructural characterization was carried out during the pre‐oxidation of Ni–20Cr–8Al alloy foam using transmission electron microscopy (TEM). During the pre‐oxidation at 1000 °C for 1, 30, and 60 min in air, the sequential formations of NiO, NiCr 2 O 4 , Cr 2 O 3 , and α‐Al 2 O 3 1‐μm‐thick oxide layers were, respectively, characterized. Initially, during pre‐oxidization, the layers formed abnormally in an island growth mode, but they grew to be morphologically uniform after 30 min. Pores were found after only 1 min in the middle region of the oxide layers, near the Cr 2 O 3 layer, and then these developed into critical micro‐cracks after 60 min. Copyright © 2017 John Wiley & Sons, Ltd.