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TOF‐SIMS imaging of polyester/melamine resin with bismuth cluster ions
Author(s) -
Nishinomiya S.,
Toshin K.,
Shishido R.,
Suzuki S.
Publication year - 2016
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6087
Subject(s) - melamine , bismuth , polyester , secondary ion mass spectrometry , formaldehyde , ion , melamine resin , chemistry , molecule , mass spectrometry , static secondary ion mass spectrometry , cluster (spacecraft) , condensation , polymer chemistry , analytical chemistry (journal) , materials science , organic chemistry , chromatography , physics , computer science , thermodynamics , programming language , coating
In recent years, secondary ion mass spectrometry (SIMS) with a time‐of‐flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF‐SIMS with a cluster ion beam (Au n , Bi n , C 60 , Ar n , etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF‐SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C 5 H 7 N 6 + ( m / z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst. Copyright © 2016 John Wiley & Sons, Ltd.