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Foucault optical system by using a nondedicated conventional TEM
Author(s) -
Nakajima Hiroshi,
Kotani Atsuhiro,
Harada Ken,
Ishii Yui,
Mori Shigeo
Publication year - 2016
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.6084
Subject(s) - optics , lens (geology) , optical axis , aperture (computer memory) , electron optics , diffraction , physics , transmission electron microscopy , phase (matter) , numerical aperture , electron , materials science , wavelength , quantum mechanics , acoustics
We have constructed an electron optical system for both Foucault imaging and small‐angle electron diffraction (SmAED) modes by using a nondedicated conventional transmission electron microscope. The objective lens is switched off as for Lorentz microscopy. An objective mini‐lens is utilized in order to make a crossover on the plane where a selected area aperture is located. The aperture works for an angular selection in the Foucault mode. The present electron optical system has two advantages: one is the independent control of the illumination and the imaging optics, and the other is the application of external magnetic fields to the specimen parallel to the optical axis with the objective lens. In SmAED mode, the maximum camera length is estimated to be approximately 1300 m. We succeeded in the observation of magnetic domain structures and SmAED patterns of the rhombohedral phase of La 0.7 Sr 0.3 MnO 3 by using the present electron optical system. Copyright © 2016 John Wiley & Sons, Ltd.