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In‐depth structural and chemical characterization of engineered TiO 2 films
Author(s) -
Ortel Erik,
Häusler Ines,
Österle Werner,
Narbey Stéphanie,
Oswald Frédéric,
Andersen Inge H.,
Holzweber Markus,
Unger Wolfgang E. S.,
Hodoroaba VasileDan
Publication year - 2016
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5966
Subject(s) - scanning electron microscope , materials science , anatase , auger electron spectroscopy , sputter deposition , transmission electron microscopy , characterization (materials science) , sputtering , analytical chemistry (journal) , energy dispersive x ray spectroscopy , microstructure , thin film , photocatalysis , nanotechnology , chemistry , composite material , biochemistry , physics , chromatography , nuclear physics , catalysis
Analytical routines for a comprehensive in‐depth morphological, structural, and chemical characterization of functionalized TiO 2 films by using different state‐of‐the‐art analytical techniques are presented and discussed with the main objective to identify potential reference TiO 2 coating parameters able to be certified at a later stage. TiO 2 films fabricated by two different synthetic procedures as representative for two main large‐scale applications were selected: (i) pulsed d.c. magnetron sputtering for photocatalytic applications and (ii) screen printing from preformed anatase nanoparticles. The screen‐printed films were further loaded with a sensitizing dye for application as a dye‐sensitized solar cell. Film properties such as microstructure and crystallographic texture of pulsed d.c. magnetron sputtering synthesized films were systematically studied by means of scanning nanobeam electron diffraction in a transmission electron microscope and the surface and inner morphology by scanning electron microscopy. The dye distribution over the depth of screen‐printed TiO 2 layers was analyzed before and after dye‐loading by means of energy dispersive X‐ray spectroscopy at scanning electron microscope, Auger electron spectroscopy and time‐of‐flight secondary ion mass spectrometry. The long‐term goal of the present study is the improvement of quality of the TiO 2 film parameters as measured by using different types of reference TiO 2 coatings having specific parameters certified. Copyright © 2016 John Wiley & Sons, Ltd.