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Analysis of hydrogen in materials with and without high hydrogen mobility
Author(s) -
Stevie F. A.
Publication year - 2016
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5930
Subject(s) - hydrogen , nuclear reaction analysis , deuterium , tritium , niobium , analytical chemistry (journal) , chemistry , silicon , hydrogen storage , materials science , chemical physics , atomic physics , nuclear physics , optoelectronics , physics , metallurgy , organic chemistry , chromatography
Hydrogen is a very important element but analysis of hydrogen in solids can be difficult and is not available for many analytical techniques. This paper provides an overview of the capabilities of SIMS and NRA to measure hydrogen concentrations and distributions. Bulk analysis methods provide an overall result, but depth profiles are often needed. SIMS can produce useful and quantifiable depth profiles for hydrogen and the isotopes deuterium and tritium. Hydrogen analysis at the surface and imaging with good lateral resolution can also be achieved with SIMS. However, hydrogen can have high mobility in a variety of materials and this will affect SIMS analysis. For those cases, other surface analysis methods such as hydrogen forward scattering and nuclear reaction analysis are preferred. Hydrogen analysis examples in silicon and in niobium are used for materials without and with high hydrogen mobility respectively. Copyright © 2016 John Wiley & Sons, Ltd.