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Molecular ME‐ToF‐SIMS yield as a function of DHB matrix layer thicknesses obtained from brain sections coated by sublimation/deposition techniques
Author(s) -
Körsgen Martin,
Pelster Andreas,
VensCappell Simeon,
Roling Oliver,
Arlinghaus Heinrich F.
Publication year - 2016
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5885
Subject(s) - sublimation (psychology) , chemistry , secondary ion mass spectrometry , analytical chemistry (journal) , yield (engineering) , matrix (chemical analysis) , nanometre , layer (electronics) , coating , mass spectrometry , ion , deposition (geology) , materials science , chromatography , organic chemistry , composite material , psychology , paleontology , sediment , psychotherapist , biology
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) can be used to image biological samples with nanometer‐scale resolution, albeit with the drawback that it often cannot detect large molecular signals. One way to increase secondary ion molecular yield is to chemically modify the surface in the so‐called matrix‐enhanced SIMS (ME‐SIMS) approach, which is based on embedding analyte molecules in low‐weight organic matrices. In this study, a solvent‐free sample preparation technique was employed using sublimation/deposition for coating a mouse brain section with a thin layer of a 2,5‐dihydroxybenzoic acid (DHB) matrix. Using this preparation technique, signal enhancements of up to a factor of 18 could be detected. It was found that the matrix layer thickness plays an important role in the efficiency of yield enhancement. Also, a complex influence of the matrix layer on various signals was observed. Copyright © 2015 John Wiley & Sons, Ltd.