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Extraction of hidden information of ToF‐SIMS data using different multivariate analyses
Author(s) -
Yokoyama Yuta,
Kawashima Tomoko,
Ohkawa Mayumi,
Iwai Hideo,
Aoyagi Satoka
Publication year - 2015
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5731
Subject(s) - principal component analysis , multivariate statistics , secondary ion mass spectrometry , sputtering , analytical chemistry (journal) , chemistry , mass spectrometry , resolution (logic) , multivariate analysis , sample (material) , materials science , chromatography , computer science , nanotechnology , artificial intelligence , statistics , thin film , mathematics
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool for determining surface information of complex systems such as polymers and biological materials. However, the interpretation of ToF‐SIMS raw data is often difficult. Multivariate analysis has become effective methods for the interpretation of ToF‐SIMS data. Some of multivariate analysis methods such as principal component analysis and multivariate curve resolution are useful for simplifying ToF‐SIMS data consisting of many components to that explained by a smaller number of components. In this study, the ToF‐SIMS data of four layers of three polymers was analyzed using these analysis methods. The information acquired by using each method was compared in terms of the spatial distribution of the polymers and identification. Moreover, in order to investigate the influence of surface contamination, the ToF‐SIMS data before and after Ar cluster ion beam sputtering was compared. As a result, materials in the sample of multiple components, including unknown contaminants, were distinguished. Copyright © 2014 John Wiley & Sons, Ltd.