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Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials
Author(s) -
Suzuki Masato,
Nojima Masashi,
Fujii Makiko,
Seki Toshio,
Matsuo Jiro
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5696
Subject(s) - secondary ion mass spectrometry , static secondary ion mass spectrometry , chemistry , analytical chemistry (journal) , mass spectrum , ion , mass spectrometry , polypropylene , polyethylene , polymer , sputtering , thin film , materials science , nanotechnology , chromatography , organic chemistry
Generally, dynamic secondary ion mass spectrometry (SIMS) has been mainly used as one of the most powerful tools for inorganic mass analysis. On the other hand, an Ar gas cluster ion beam (GCIB) has been developed and spread as a processing tool for surface flattening and also a projectile for time‐of‐flight (ToF) SIMS. In this study, we newly introduced an Ar‐GCIB as a primary ion source to a commercially available dynamic SIMS apparatus, and investigated mass spectra of amino acid films (such as arginine and glycine) and polymer films (polyethylene: PE and polypropylene: PP) as organic model samples. As a result, each characteristic fragment peak indicating the original molecular organic structure was observed in the acquired mass spectra. In addition, their own molecular ions of the amino acids were also clearly observed. Mass spectra of PE/PP blended‐polymer films acquired using Ar‐GCIB‐dynamic SIMS could be identified between pure PE and PE:PP = 1:3 mixture by applying principal components analysis. Copyright © 2014 John Wiley & Sons, Ltd.