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Analysis of liposome model systems by time‐of‐flight secondary ion mass spectrometry
Author(s) -
Lovrić Jelena,
Keighron Jacqueline D.,
Angerer Tina B.,
Li Xianchan,
Malmberg Per,
Fletcher John S.,
Ewing Andrew G.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5623
Subject(s) - liposome , secondary ion mass spectrometry , chemistry , mass spectrometry , micrometer , time of flight , analytical chemistry (journal) , vesicle , ion , resolution (logic) , characterization (materials science) , aqueous solution , chromatography , nanotechnology , membrane , materials science , optics , organic chemistry , biochemistry , physics , artificial intelligence , computer science
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF‐SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two‐phase system‐containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi 3 + and C 60 + ion sources. The depth profiling capability of ToF‐SIMS was used to investigate the liposome interior. Copyright © 2014 John Wiley & Sons, Ltd.