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Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions
Author(s) -
Tuggle Jay,
Giordani Andrew,
Kulkarni Nagraj,
Warmack Bruce,
Hunter Jerry
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5618
Subject(s) - tracer , secondary ion mass spectrometry , diffusion , chemistry , analytical chemistry (journal) , isotope , mass spectrometry , ion , static secondary ion mass spectrometry , self diffusion , radiochemistry , chromatography , thermodynamics , nuclear physics , physics , computer science , organic chemistry , self service , computer security
A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self‐diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self‐diffusion coefficients and can be used as a routine method for determining diffusion coefficients. Copyright © 2014 John Wiley & Sons, Ltd.