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TOF–SIMS study of polyester/melamine resin with Ar gas cluster ion beam
Author(s) -
Nishinomiya S.,
Toshin K.,
Hayashi S.,
Iuchi K.,
Se N.,
Moritani K.,
Mochiji K.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5613
Subject(s) - trimer , melamine , secondary ion mass spectrometry , wafer , static secondary ion mass spectrometry , ion beam , polyester , analytical chemistry (journal) , chemistry , ion , mass spectrometry , molecule , monomer , cluster (spacecraft) , materials science , polymer , dimer , nanotechnology , organic chemistry , chromatography , computer science , programming language
A pre‐coated steel sheet for household electrical appliances needs to be highly formable and stain resistant. In recent years, secondary ion mass spectrometry (SIMS) with a time‐of‐flight (TOF) mass analyzer with an Ar gas cluster ion beam (Ar–GCIB) has been widely used as a structure analysis technology of organic molecules. In this paper, we looked into the effectiveness of Ar–GCIB–TOF–SIMS as a structure analysis technique of paint film. As a result, we could detect the trimer fragment ions of hexamethoxymethylmelamine in the range of m / z = 400–800 for the first time for the spin‐coating of HMMM on a Si wafer. By evaluation of characteristic monomer fragment ions, we could find out the different surface distributions of melamine‐formaldehyde resin with the different formulations of paint films. Copyright © 2014 John Wiley & Sons, Ltd.
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