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ToF‐SIMS imaging of plasma membrane lipids with sub‐micrometer resolution
Author(s) -
Draude F.,
Pelster A.,
Körsgen M.,
Kassenböhmer R.,
Schwerdtle T.,
Müthing J.,
Arlinghaus H. F.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5576
Subject(s) - membrane , wafer , secondary ion mass spectrometry , yield (engineering) , chemistry , resolution (logic) , phosphatidylcholine , sphingomyelin , silicon , layer (electronics) , analytical chemistry (journal) , molecule , materials science , mass spectrometry , chromatography , nanotechnology , phospholipid , organic chemistry , biochemistry , composite material , artificial intelligence , computer science
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was used for label‐free analyses of the molecular lateral distribution of two different epithelial cell membranes (PANC‐1 and UROtsa). The goal of the research was to enhance the ion yield of specific membrane molecules for improving the membrane imaging capability of ToF‐SIMS on the nanoscale lateral dimension. For this task, a special silicon wafer sandwich preparation technique was optimized using different wafer materials, spacers, and washing procedures. Under optimized preparation conditions, the yield could be significantly enhanced, allowing imaging of the inhomogeneous distribution of phosphocholine (common head group for phosphatidylcholine and sphingomyelin) of a PANC‐1 cell membrane's outer lipid layer with a lateral resolution of less than 200 nm. Copyright © 2014 John Wiley & Sons, Ltd.