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XPS analysis of small particles by proximal X‐ray generation
Author(s) -
Castle James Eric,
Grilli Rossana,
Mallinson Christopher F.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5452
Subject(s) - x ray photoelectron spectroscopy , auger , auger electron spectroscopy , particle (ecology) , substrate (aquarium) , aluminium , chemical state , copper , x ray , work (physics) , materials science , auger effect , analytical chemistry (journal) , chemistry , atomic physics , metallurgy , physics , optics , nuclear physics , nuclear magnetic resonance , thermodynamics , oceanography , chromatography , geology
In this work, the feasibility of XPS analysis using locally generated Al Kα radiation has been demonstrated. Both photo and Auger‐electron signals can be obtained from a single, sub‐micrometre, particle, achieving the aim of chemical state identification by means of the Auger parameter. The results, demonstrated in this work using copper particles on an aluminium substrate, suggest that the technique, with further development, will be valuable for those concerned with the health hazards of nano‐particles in general. Copyright © 2014 John Wiley & Sons, Ltd.