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Traceable measurement of specific organic species at industrially relevant surface by infrared spectroscopy
Author(s) -
Giovannozzi Andrea Mario,
Pennecchi Francesca,
Saverino Antonio,
Lobascio Cesare,
Rossi Andrea Mario
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5447
Subject(s) - contamination , calibration , cleanroom , fourier transform infrared spectroscopy , process engineering , environmental science , spacecraft , metrology , computer science , systems engineering , nanotechnology , materials science , aerospace engineering , engineering , chemical engineering , physics , optics , ecology , quantum mechanics , biology
Deposition of organic materials on hardware, high tech vacuum components and spacecraft materials is a common risk in the fabrication of space industry instrumentations, which often leads to impair their functionality. Metrological procedures that meet the industrial needs are urgently required in order to detect and quantify a contamination at relevant surfaces. In this work, a direct method based on Fourier transform infrared spectroscopy (FTIR) was developed providing both qualitative and quantitative information on the source of the contamination. According to Thales Alenia Space (TAS) requirements, three main categories of contaminants were selected: hydrocarbons, esters and silicones. Traceable reference materials belonged to these categories were chosen and used for calibration equipment. A practice to assist in the preparation of the calibration curves of the selected standards within the concentration range useful for practical applications is here presented. This methodology was further applied in the framework of BepiColombo program to detect organic contamination into TAS2 and 2B cleanrooms, and it resulted to meet the industrial needs for monitoring surface contaminants. Copyright © 2014 John Wiley & Sons, Ltd.