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Crystal structure of oxide layers on Mo‐added Fe‐Cr Alloys studied by GIXS and XPS
Author(s) -
Nagoshi M.,
Makiishi N.,
Hamada E.,
Kawano T.,
Ishii K.,
Okada S.,
Sato M.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5435
Subject(s) - x ray photoelectron spectroscopy , diffraction , crystallite , alloy , polishing , oxide , materials science , scattering , analytical chemistry (journal) , crystallography , chemistry , metallurgy , chemical engineering , optics , engineering , physics , chromatography
The grazing incident X‐ray scattering (GIXS) and XPS measurements were carried out for as‐polished surfaces of polycrystalline Fe‐Cr ferritic alloys with and without Mo. The GIXS patterns from the oxide layers consist of the diffraction peaks from Cr 2 O 3 and the broad scattering peaks. The intensities of the diffraction peaks tended to increase as the thickness of the oxide layers on the samples became larger and their content of Cr estimated by XPS decreased. However, the intensities of the diffraction peaks changed independently of the alloy compositions as well as the dependence of the thickness and Cr content of the layers on the alloy compositions. Contaminations such as Na and S spontaneously mixed during polishing treatments are considered to be a possible reason of the formation of crystalline Cr 2 O 3 on the surfaces. Copyright © 2014 John Wiley & Sons, Ltd.